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Rukdee, S.; Burwitz, V.; Hartner, G.; Müller, T.; Schmidt, T.; Langmeier, A.; Bradshaw, M.: X-ray ray tracing with Zemax for the PANTER testing facility. In: Optics for EUV, X-Ray, and Gamma-Ray Astronomy X, Bd. 11822. SPIE OPTICAL ENGINEERING + APPLICATIONS, San Diego, CA, 01. August 2021 - 05. August 2021. (2021)

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