Analysis of the X-ray spectrum of source 178

X-ray spectrum of source 23397 in Hsu et al. 2014 (Id 178 in Rangel et al. 2013):

Please refer to Buchner et al. (2014) for the spectral analysis method. The spectral fitting parameters (intrinsic luminosity, obscuring column density NH, soft scattering powerlaw fraction, redshift) are tabulated in the published Vizier catalogue.