Analysis of the X-ray spectrum of source 176

X-ray spectrum of source 24210 in Hsu et al. 2014 (Id 176 in Rangel et al. 2013):

Please refer to Buchner et al. (2014) for the spectral analysis method. The spectral fitting parameters (intrinsic luminosity, obscuring column density NH, soft scattering powerlaw fraction, redshift) are tabulated in the published Vizier catalogue.