X-ray spectrum of source 65279 in Hsu et al. 2014 (Id 435 in Rangel et al. 2013):
Please refer to Buchner et al. (2014) for the spectral analysis method. The spectral fitting parameters (intrinsic luminosity, obscuring column density NH, soft scattering powerlaw fraction, redshift) are tabulated in the published Vizier catalogue.
