X-ray spectrum of source 75176 in Hsu et al. 2014 (Id 364 in Rangel et al. 2013):
Please refer to Buchner et al. (2014) for the spectral analysis method. The spectral fitting parameters (intrinsic luminosity, obscuring column density NH, soft scattering powerlaw fraction, redshift) are tabulated in the published Vizier catalogue.
