Analysis of the X-ray spectrum of source 320

X-ray spectrum of source 579 in Nandra et al. (submitted), X-ray ID 320.

Please refer to Buchner et al. (2014) for the spectral analysis method. The spectral fitting parameters (intrinsic luminosity, obscuring column density NH, soft scattering powerlaw fraction, redshift) are not published yet (contact Johannes Buchner)

To the photometry and SED fitting of this source
back to the XRaySurveys/AEGIS-X page
Impressum