Analysis of the X-ray spectrum of source 172
X-ray spectrum of source 311 in Nandra et al. (submitted), X-ray ID 172.
Please refer to Buchner et al. (2014) for the spectral analysis method. The spectral fitting parameters (intrinsic luminosity, obscuring column density NH, soft scattering powerlaw fraction, redshift) are not published yet (contact Johannes Buchner)