Publikationen
Zeitschriftenartikel (1)
1.
Zeitschriftenartikel
4, S. 622 - 631 (1999)
High resolution X-ray spectroscopy close to room temperature. Microscopy and Microanalysis Konferenzbeitrag (10)
2.
Konferenzbeitrag
Overview of the calibration and the performance of the PN-CCD camera. In: EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X, S. 215 - 219 (Hg. Siegmund, O.H.W.; Flanagan, K.A.). EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X, Denver, Colorado, USA, 21. Juli 1999 - 23. Juli 1999. Society of Photo-Optical Instrumentation Engineers, Bellingham, Wash., USA (1999)
3.
Konferenzbeitrag
Determination and correction of the charge transfer efficiency of the pn-CCD camera. In: EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X, S. 232 - 243 (Hg. Siegmund, O.H.W.; Flanagan, K.A.). EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X, Denver, Colorado, USA, 21. Juli 1999 - 23. Juli 1999. Society of Photo-Optical Instrumentation Engineers, Bellingham, Wash., USA (1999)
4.
Konferenzbeitrag
The quantum efficiency of the XMM pn-CCD camera. In: EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X, S. 703 - 713 (Hg. Siegmund, O.H.W.; Flanagan, K.A.). EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X, Denver, Colorado, USA, 21. Juli 1999 - 23. Juli 1999. Society of Photo-Optical Instrumentation Engineers, Bellingham, Wash., USA (1999)
5.
Konferenzbeitrag
Operational aspects of the PN-CCD camera for XMM and ABRIXAS. In: EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X, S. 204 - 214 (Hg. Siegmund, O.H.W.; Flanagan, K.A.). EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X, Denver, Colorado, USA, 21. Juli 1999 - 23. Juli 1999. Society of Photo-Optical Instrumentation Engineers, Bellingham, Wash., USA (1999)
6.
Konferenzbeitrag
The physical model of the charge transfer loss of the pn-CCD camera. In: EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X, S. 220 - 230 (Hg. Siegmund, O.H.W.; Flanagan, K.A.). EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X, Denver, Colorado, USA, 21. Juli 1999 - 23. Juli 1999. Society of Photo-Optical Instrumentation Engineers, Bellingham, Wash., USA (1999)
7.
Konferenzbeitrag
The PN-CCD detector for XMM and ABRIXAS. In: EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X, S. 192 - 203 (Hg. Siegmund, O.H.W.; Flanagan, K.A.). EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X, Denver, Colorado, USA, 21. Juli 1999 - 23. Juli 1999. Society of Photo-Optical Instrumentation Engineers, Bellingham, Wash., USA (1999)
8.
Konferenzbeitrag
PN-CCD camera for XMM and ABRIXAS: design of the camera system. In: EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X, S. 184 - 191 (Hg. Siegmund, O.H.W.; Flanagan, K.A.). EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X, Denver, Colorado, USA, 21. Juli 1999 - 23. Juli 1999. Society of Photo-Optical Instrumentation Engineers, Bellingham, Wash., USA (1999)
9.
Konferenzbeitrag
Measurement and modeling of the detector response of pn-EPIC aboard XMM. In: EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X, S. 693 - 702 (Hg. Siegmund, O.H.W.; Flanagan, K.A.). EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X, Denver, Colorado, USA, 21. Juli 1999 - 23. Juli 1999. Society of Photo-Optical Instrumentation Engineers, Bellingham, Wash., USA (1999)
10.
Konferenzbeitrag
ABRIXAS scientific goal and mission concept. In: EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X, S. 172 - 183 (Hg. Siegmund, O.H.W.; Flanagan, K.A.). EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X, Denver, Colorado, USA, 21. Juli 1999 - 23. Juli 1999. Society of Photo-Optical Instrumentation Engineers, Bellingham, Wash., USA (1999)
11.
Konferenzbeitrag
Spectral function of an optical filter for the PN-CCD camera on board the german astronomy satellite ABRIXAS. In: EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X, S. 244 - 250 (Hg. Siegmund, O.H.W.; Flanagan, K.A.). EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X, Denver, Colorado, USA, 21. Juli 1999 - 23. Juli 1999. Society of Photo-Optical Instrumentation Engineers, Bellingham, Wash., USA (1999)