Publications of David Huber

Lippa, M.; Gillessen, S.; Blind, N.; Kok, Y.; Yazıcı, Ş.; Weber, J.; Pfuhl, O.; Haug, M.; Kellner, S.; Wieprecht, E. et al.; Eisenhauer, F.; Genzel, R.; Hans, O.; Haußmann, F.; Huber, D.; Kratschmann, T.; Ott, T.; Plattner, M.; Rau, C.; Sturm, E.; Waisberg, I.; Wiezorrek, E.; Perrin, G.; Perraut, K.; Brandner, W.; Straubmeier, C.; Amorim, A.: The metrology system of the VLTI instrument GRAVITY. In: Optical and Infrared Interferometry and Imaging V, 990722, pp. 1 - 9 (Eds. Malbet, F.; Creech-Eakman, M. J.; Tuthill, P. G.). Optical and Infrared Interferometry and Imaging V, Edinburgh, UK, June 26, 2016. (2016)

Lippa, M.; Blind, N.; Gillessen, S.; Kok, Y.; Weber, J.; Eisenhauer, F.; Pfuhl, O.; Janssen, A.; Haug, M.; Haußmann, F. et al.; Kellner, S.; Hans, O.; Wieprecht, E.; Ott, T.; Burtscher, L.; Genzel, R.; Sturm, E.; Hofmann, R.; Huber, S.; Huber, D.; Senftleben, S.; Pflüger, A.; Greßmann, R.; Perrin, G.; Perraut, K.; Brandner, W.; Straubmeier, C.; Amorim, A.; Schöller, M.: The GRAVITY metrology system: narrow-angle astrometry via phase-shifting interferometry. In: Optical and Infrared Interferometry IV, 914622, pp. 1 - 11 (Eds. Rajagopal, J. K.; Creech-Eakman, M. J.; Malbet, F.). Optical and Infrared Interferometry IV, Montreal, Canada, June 23, 2014 - June 27, 2014. (2014)