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Pareschi, G.; Civitani, M.; Sironi, G.; Yang, Y.; Cotroneo, V.; Valsecchi, G.; Magagnin, L.; Döhring, T.; Bradshaw, M.; Burwitz, V. et al.; Pelliciari, C.: Soft x-ray reflectivity-enhancement in astronomical telescopes via overcoatings: alternative materials and deposition methods. In: Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX, Vol. 11119, 111190S (Eds. O'Dell, S. L.; Pareschi, G.). SPIE OPTICAL ENGINEERING + APPLICATIONS, San Diego, CA, August 11, 2019 - August 15, 2019. (2019)

Collon, M. J.; Vacanti, G.; Barrière, N. M.; Landgraf, B.; Günther, R.; Vervest, M.; Voruz, L.; Verhoeckx, S.; Babić, L.; Keek, L. et al.; Girou, D.; Okma, B.; Hauser, E.; Beijersbergen, M. W.; Bavdaz, M.; Wille, E.; Fransen, S.; Shortt, B.; Ferreira, I.; Haneveld, J.; Koelewijn, A.; Start, R.; Wijnperle, M.; Lankwarden, J.-J.; van Baren, C.; Hieltjes, P.; den Herder, J. W.; Müller, P.; Handick, E.; Krumrey, M.; Bradshaw, M.; Burwitz, V.; Pareschi, G.; Massahi, S.; Svendsen, S.; Ferreira, D. D. M.; Christensen, F. E.; Valsecchi, G.; Oliver, P.; Chequer, I.; Ball, K.: Status of the silicon pore optics technology. In: Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX, Vol. 11119, 111190L (Eds. O'Dell, S. L.; Pareschi, G.). SPIE OPTICAL ENGINEERING + APPLICATIONS, San Diego, CA, August 11, 2019 - August 15, 2019. (2019)

Bradshaw, M.; Burwitz, V.; Hartner, G.; Pelliciari, C.; Langmeier, A.; Liao, Y.; Friedrich, P.; Valsecchi, G.; Barričre, N.; Collon, M. J. et al.; Vacanti, G.: Developments in testing x-ray optics at MPE's PANTER facility. In: Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX, Vol. 11119, 1111916 (Eds. O'Dell, S. L.; Pareschi, G.). SPIE OPTICAL ENGINEERING + APPLICATIONS, San Diego, CA, August 11, 2019 - August 15, 2019. (2019)