Publikationen von Vadim Burwitz

Collon, M. J.; Abalo, L.; Barrière, N. M.; Bayerle, A.; Castiglione, L.; Eenkhoorn, N.; Girou, D.; Günther, R.; Hauser, E.; van der Hoeven, R. et al.; den Hollander, J.; Jenkins, Y.; Landgraf, B.; Keek, L.; Okma, B.; da Ribeiro, P. S.; Rizzos, C.; Thete, A.; Vacanti, G.; Verhoeckx, S.; Vervest, M.; Visser, R.; Voruz, L.; Bavdaz, M.; Wille, E.; Ferreira, I.; Riekerink, M. O.; Haneveld, J.; Koelewijn, A.; Wijnperle, M.; Lankwarden, J.-J.; Schurink, B.; Start, R.; van Baren, C.; den Herder, J.-W.; Handick, E.; Krumrey, , M.; Burwitz, V.; Massahi, S.; Ferreira, D. D. M.; Svendsen, S.; Christensen, F. E.; Mundon, W.; Phillips, G.: The development of the mirror for the Athena x-ray mission. In: Space Telescopes and Instrumentation 2022: Ultraviolet to Gamma Ray, Bd. 12181, 121810U . SPIE ASTRONOMICAL TELESCOPES + INSTRUMENTATION, Montréal, Québec, Canada, 17. Juli 2022 - 23. Juli 2022. (2022)

Coutinho, D.; Ramos-Ceja, M. E.; Dennerl, K.; Haberl, F.; Meidinger, N.; Merloni, A.; Predehl, P.; Stewart, I.; Freyberg, M.; Bornemann, W. et al.; Brunner, H.; Burwitz, V.; Czesla, S.; Eder, J.; Friedrich, S.; Gaida, R.; Gueguen, A.; Hartner, G.; Kink, W.; Kreykenbohm, I.; Lamer, G.; Maitra, C.; Mernik, T.; Mueller, S.; Nandra, P.; Pfeffermann, E.; Robrade, J.: SRG/eROSITA status and operations during the first four all-sky surveys. In: Space Telescopes and Instrumentation 2022: Ultraviolet to Gamma Ray, Bd. 12181. SPIE Astronomical Telescopes + Instrumentation,, Montréal, Québec, Canada, 17. Juli 2022 - 23. Juli 2022. (2022)

Heilmann, R. K.; Bruccoleri, A. R.; Burwitz, V.; Cheimets, P.; DeRoo, C.; Garner, A.; Gullikson, E. M.; Günther, H. M.; Hartner, G.; Hertz, E. et al.; Langmeier, A.; Mueller, A.; Rukdee, S.; Schmidt, T.; Smith, R. K.; Schattenburg, M. L.: Flight-like critical-angle transmission grating x-ray performance for Arcus. In: Space Telescopes and Instrumentation 2022: Ultraviolet to Gamma Ray, Bd. 12181. SPIE Astronomical Telescopes + Instrumentation,, Montréal, Québec, Canada, 17. Juli 2022 - 23. Juli 2022. (2022)

Madsen, K. K.; Baumgartner, W.; Kegley, J.; Wright, E.; Breunig, E.; Burwitz, V.; Ferreira, I.; Ptak, A.: Simulations of the ATHENA performance verification testing at XRCF. In: Space Telescopes and Instrumentation 2022: Ultraviolet to Gamma Ray, Bd. 12181. SPIE Astronomical Telescopes + Instrumentation,, Montréal, Québec, Canada, 17. Juli 2022 - 23. Juli 2022. (2022)

Mercier, K.; Gonzalez, F.; Götz, D.; Boutelier, M.; Boufracha, N.; Clamagirand, S.; Fort, A.; Gomes, A.; Guilhem, E.; Le Duigou, J.-M. et al.; Mazeau, S.; Sanisidro, J.; Meuris, A.; Feldman, C.; Pearson, J.; Willingale, R.; Burwitz, V.; Meidinger, N.; Robinet, F.: Results of the development of the MXT x-ray telescope for the SVOM mission. In: Space Telescopes and Instrumentation 2022: Ultraviolet to Gamma Ray, Bd. 12181. SPIE Astronomical Telescopes + Instrumentation,, Montréal, Québec, Canada, 17. Juli 2022 - 23. Juli 2022. (2022)

Salmaso, B.; Basso, S.; Ghigo, M.; Spiga, D.; Vecchi, G.; Sironi, G.; Cotroneo, V.; Conconi, P.; Redaelli, E.; Bianco, A. et al.; Pareschi, G.; Tagliaferri, G.; Sisana, D.; Pelliciari, C.; Fiorini, M.; Incorvaia, S.; Uslenghi, M.; Paoletti, L.; Ferrari, C.; Lolli, R.; Zappettini, A.; Rio, M. S. d.; Parodi, G.; Burwitz, V.; Rukdee, S.; Hartner, G.; Müller, T.; Schmidt, T.; Langmeier, A.; Ferreira, D. D.; Massahi, S.; Gellert, N. C.; Christensen, F.; Bavdaz, M.; Ferreira, I.; Collon, M.; Vacanti, G.; Barrière, N.: X-ray tests of the ATHENA mirror modules in BEaTriX: from design to reality. In: Space Telescopes and Instrumentation 2022: Ultraviolet to Gamma Ray, Bd. 12181. SPIE Astronomical Telescopes + Instrumentation,, Montréal, Québec, Canada, 17. Juli 2022 - 23. Juli 2022. (2022)

Smith, R. K.; Bautz, M.; Bregman, J.; Brenneman, L.; Brickhouse, N.; Bulbul, E.; Burwitz, V.; Bushman, J.; Canizares, C.; Chakrabarty, D. et al.; Cheimets, P.; Costantini, E.; DeRoo, C.; Falcone, A.; Foster, A.; Gallo, L.; Grant, C.; Guenther, H. M.; Heilmann, R. K.; Heine, S.; Hine, B.; Huenemoerder, D.; Jara, S.; Kaastra, J.; Kara, E.; Kreykenbohm, I.; Madsen, K.; Marshall, H.; McDonald, M.; McEntaffer, R.; Miller, J.; Miller, E.; Mushotzky, R.; Nandra, K.; Nowak, M.; Paerels, F.; Petre, R.; Poppenhaeger, K.; Ptak, A.; Reid, P.; Ronzano, K.; Rozanska, A.; Samra, J.; Sanders, J.; Schattenburg, M.; Schonfeld, J.; Schulz, N.; Smale, A.; Temi, P.; Valencic, L.; Walker, S.; Wilms, J.; Wolk, S.: Arcus - Exploring the formation and evolution of clusters, galaxies and stars. In: Space Telescopes and Instrumentation 2022: Ultraviolet to Gamma Ray, Bd. 12181. SPIE Astronomical Telescopes + Instrumentation,, Montréal, Québec, Canada, 17. Juli 2022 - 23. Juli 2022. (2022)

U., C. K. P.; Walsh, B.; Kuntz, K. D.; Nutter, R.; Connor, C.; Busk, S.; Burwitz, V.; Hartner, G.; Müller, T.; Rukdee, S. et al.; Schmidt, T.; Atz, E.; Dobson, N.; Chornay, D.; Porter, F. S.; Simms, K.; Naldoza, V.; Sembay, S.; Sibeck, D. G.; Thomas, N.: X-ray micropore optic array preliminary calibration results for the lunar environment heliospheric x-ray imager. In: Space Telescopes and Instrumentation 2022: Ultraviolet to Gamma Ray, Bd. 12181, 121814N . SPIE ASTRONOMICAL TELESCOPES + INSTRUMENTATION, Montréal, Québec, Canada, 17. Juli 2022 - 23. Juli 2022. (2022)

Vernani, D.; Bianucci, G.; Grisoni, G.; Marioni, F.; Valsecchi, G.; Keereman, A.; Chen, Y.; Cong, M.; Yang, Y.; Wang, J. et al.; Burwitz, V.; Eder, J.; Friedrich, P.; Hartner, G.; Langmeier, A.; Mueller, T.; Rukdee, S.; Schmidt, T.: Follow-up x-ray telescope (FXT) mirror module for the Einstein probe mission. In: Space Telescopes and Instrumentation 2022: Ultraviolet to Gamma Ray, Bd. 12181, 121811R . SPIE ASTRONOMICAL TELESCOPES + INSTRUMENTATION, Montréal, Québec, Canada, 17. Juli 2022 - 23. Juli 2022. (2022)

Le Duigou, J. M.; Boufracha, N.; Burwitz, V.; Clamagirand, S.; Feldman, C. F.; Gomes, A.; Gonzalez, F.; Götz, D.; Mercier, K.; Meuris, A. et al.; O'Brien, P. T.; Pasquier, P.; Pearson, J. F.; Renault-Tinacci, N.; Roucayrol, L.; Tourrette, T.; Willingale, R.: Stability and assembly precision of MXT line of sight. In: MODELING, SYSTEMS ENGINEERING, AND PROJECT MANAGEMENT FOR ASTRONOMY X, Bd. 12187, 121870I . Conference on Modeling, Systems Engineering, and Project Management for Astronomy X, Montreal, CANADA, 17. Juli 2022 - 20. Juli 2022. (2022)

Barrière, N. M.; Babić, L.; Bayerle, A.; Castiglione, L.; Collon, M. J.; Eenkhoorn, N.; Girou, D.; Günther, R.; Hauser, E.; Jenkins, Y. et al.; Landgraf, B.; Keek, L.; Okma, B.; Serano, G. M.; Thete, A.; Vacanti, G.; Verhoeckx, S.; Vervest, M.; Voruz, L.; Beijersbergen, M. W.; Bavdaz, M.; Wille, E.; Ferreira, I.; Fransen, S.; Riekerink, M. O.; Haneveld, J.; Schurink, B.; Start, R.; van Baren, C.; Handick, E.; Krumrey, M.; Valsecchi, G.; Bradshaw, M.; Burwitz, V.: Assembly of confocal Silicon Pore Optics mirror modules. In: Optics for EUV, X-Ray, and Gamma-Ray Astronomy X, Bd. 11822. SPIE OPTICAL ENGINEERING + APPLICATIONS, San Diego, CA, 01. August 2021 - 05. August 2021. (2021)

Landgraf, B.; Babić, L.; Barrière, N. M.; Bayerle, A.; Castiglione, L.; Collon, M. J.; Eenkhoorn, N.; Girou, D.; Günther, R.; Hauser, E. et al.; Jenkins, Y.; Keek, L.; Okma, B.; Serano, G. M.; Thete, A.; Vacanti, G.; Verhoeckx, S.; Vervest, M.; Voruz, L.; Beijersbergen, M. W.; Bavdaz, M.; Wille, E.; Ferreira, I.; Fransen, S.; Shortt, B.; Riekerink, M. O.; Haneveld, J.; Koelewijn, A.; Wijnperlé, M.; Lankwarden, J.-J.; Schurink, B.; Start, R.; van Baren, C.; Hieltjes, P.; den Herder, J.-W.; Handick, E.; Krumrey, M.; Bradshaw, M.; Burwitz, V.; Massahi, S.; Svendsen, S.; Ferreira, D. D. M.; Christensen, F. E.; Valsecchi, G.; Kailla, G.; Phillips, G.; Mundon, W.; Chequer, I.; Ball, K.: SPO mirror plate production and coating. In: Optics for EUV, X-Ray, and Gamma-Ray Astronomy X, Bd. 11822. SPIE OPTICAL ENGINEERING + APPLICATIONS, San Diego, CA, 01. August 2021 - 05. August 2021. (2021)

Collon, M. J.; Babic, L.; Barrière, N. M.; Bayerle, A.; Castiglione, L.; Eenkhoorn, N.; Girou, D.; Günther, R.; Hauser, E.; Jenkins, Y. et al.; Landgraf, B.; Keek, L.; Okma, B.; Serrano, G. M.; Thete, A.; Vacanti, G.; Verhoeckx, S.; Vervest, M.; Voruz, L.; Beijersbergen, M. W.; Bavdaz, M.; Wille, E.; Ferreira, I.; Fransen, S.; Shortt, B.; Riekerink, M. O.; Haneveld, J.; Koelewijn, A.; Wijnperle, M.; Lankwarden, J.-J.; Schurink, B.; Start, R.; van Baren, C.; Hieltjes, P.; den Herder, J.-W.; Handick, E.; Krumrey, M.; Bradshaw, M.; Burwitz, V.; Massahi, S.; Svendsen, S.; Ferreira, D. D. M.; Christensen, F. E.; Valsecchi, G.; Kailla, G.; Mundon, W.; Philips, G.; Ball, K.: Silicon Pore Optics X-ray mirror development for the ATHENA telescope. In: Optics for EUV, X-Ray, and Gamma-Ray Astronomy X, Bd. 11822. SPIE OPTICAL ENGINEERING + APPLICATIONS, San Diego, CA, 01. August 2021 - 05. August 2021. (2021)

Bavdaz, M.; Wille, E.; Ayre, M.; Ferreira, I.; Shortt, B.; Fransen, S.; Millinger, M.; Collon, M. J.; Vacanti, G.; Barriere, N. M. et al.; Landgraf, B.; Riekerink, M. O.; Haneveld, J.; Start, R.; van Baren, C.; Ferreira, D. D. M.; Massahi, S.; Svendsen, S.; Christensen, F.; Krumrey, M.; Handick, E.; Burwitz, V.; Bradshaw, M.; Pareschi, G.; Valsecchi, G.; Vernani, D.; Kailla, G.; Mundon, W.; Phillips, G.; Schneider, J.; Korhonen, T.; Sanchez, A.; Heinis, D.; Colldelram, C.; Torti, M.; Willingale, R.: ATHENA x-ray optics development and accommodation. In: Optics for EUV, X-Ray, and Gamma-Ray Astronomy X, Bd. 11822. SPIE OPTICAL ENGINEERING + APPLICATIONS, San Diego, CA, 01. August 2021 - 05. August 2021. (2021)

Bradshaw, M.; Burwitz, V.; Hartner, G.; Langmeier, A.; Müller, T.; Rukdee, S.; Schmidt, T.; Girou, D.; Vacanti, G.; Collon, M. J. et al.; Ferreira, I.: Effect of particulate contamination on a silicon pore optic. In: Optics for EUV, X-Ray, and Gamma-Ray Astronomy X, Bd. 11822. SPIE OPTICAL ENGINEERING + APPLICATIONS, San Diego, CA, 01. August 2021 - 05. August 2021. (2021)

Rukdee, S.; Burwitz, V.; Hartner, G.; Müller, T.; Schmidt, T.; Langmeier, A.; Bradshaw, M.: X-ray ray tracing with Zemax for the PANTER testing facility. In: Optics for EUV, X-Ray, and Gamma-Ray Astronomy X, Bd. 11822. SPIE OPTICAL ENGINEERING + APPLICATIONS, San Diego, CA, 01. August 2021 - 05. August 2021. (2021)

Salmaso, B.; Basso, S.; Cotroneo, V.; Ghigo, M.; Pareschi, G.; Redaelli, E.; Sironi, G.; Spiga, D.; Tagliaferri, G.; Vecchi, G. et al.; Fiorini, M.; Incorvaia, S.; Uslenghi, M.; Paoletti, L.; Ferrari, C.; Zappettini, A.; Lolli, R.; Rio, M. S. d.; Burwitz, V.; Christensen, F.; Ferreira, D. D.; Gellert, N. C.; Massahi, S.; Bavdaz, M.; Ferreira, I.: Building the BEaTriX facility for the ATHENA mirror modules X-ray testing. In: Optics for EUV, X-Ray, and Gamma-Ray Astronomy X, Bd. 11822. SPIE OPTICAL ENGINEERING + APPLICATIONS, San Diego, CA, 01. August 2021 - 05. August 2021. (2021)

Vecchi, G.; Cotroneo, V.; Ghigo, M.; Basso, S.; Salmaso, B.; Sironi, G.; Spiga, D.; Conconi, P.; Pareschi, G.; Tagliaferri, G. et al.; Burwitz, V.; Hartner, G.; Müller, T.; Rukdee, S.; Schmidt, T.; Christensen, F.; Ferreira, D. D. M.; Gellert, N. C.; Massahi, S.; Bavdaz, M.; Ferreira, I.: Manufacturing and testing of the X-ray collimating mirror for the BEaTriX facility. In: Optics for EUV, X-Ray, and Gamma-Ray Astronomy X, Bd. 11822. SPIE OPTICAL ENGINEERING + APPLICATIONS, San Diego, CA, 01. August 2021 - 05. August 2021. (2021)

Bradshaw, M.; Burwitz, V.; Friedrich, P.; Hartner, G.; Langmeier, A.; Valsecchi, G.; Vernani, D.; Chen, Y.: X-ray testing of the Einstein Probe follow-up x-ray telescope STM at MPE’s PANTER facility. In: Space Telescopes and Instrumentation 2020: Ultraviolet to Gamma Ray, Bd. 11444, 1144457 . Conference on Space Telescopes and Instrumentation - Ultraviolet to Gamma Ray / SPIE Astronomical Telescopes + Instrumentation Conference, ELECTR NETWORK, 14. Dezember 2020 - 18. Dezember 2020. (2020)

Burwitz, V.; Bradshaw, M.; Eder, J.; Breunig, E.; Ayre, M.; Bavdaz, M.; Ferreira, I.: Design of a new long beam x-ray test facility for ATHENA. In: Space Telescopes and Instrumentation 2020: Ultraviolet to Gamma Ray, Bd. 11444, 114444L . Conference on Space Telescopes and Instrumentation - Ultraviolet to Gamma Ray / SPIE Astronomical Telescopes + Instrumentation Conference, ELECTR NETWORK, 14. Dezember 2020 - 18. Dezember 2020. (2020)