Publikationen von Miranda Bradshaw
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Konferenzbeitrag (6)
1.
Konferenzbeitrag
11444, 1144457 . Conference on Space Telescopes and Instrumentation - Ultraviolet to Gamma Ray / SPIE Astronomical Telescopes + Instrumentation Conference, ELECTR NETWORK, 14. Dezember 2020 - 18. Dezember 2020. (2020)
X-ray testing of the Einstein Probe follow-up x-ray telescope STM at MPE’s PANTER facility. In: Space Telescopes and Instrumentation 2020: Ultraviolet to Gamma Ray, Bd. 2.
Konferenzbeitrag
11444, 114444L . Conference on Space Telescopes and Instrumentation - Ultraviolet to Gamma Ray / SPIE Astronomical Telescopes + Instrumentation Conference, ELECTR NETWORK, 14. Dezember 2020 - 18. Dezember 2020. (2020)
Design of a new long beam x-ray test facility for ATHENA. In: Space Telescopes and Instrumentation 2020: Ultraviolet to Gamma Ray, Bd. 3.
Konferenzbeitrag
11444, 114441H . Conference on Space Telescopes and Instrumentation - Ultraviolet to Gamma Ray / SPIE Astronomical Telescopes + Instrumentation Conference, ELECTR NETWORK, 14. Dezember 2020 - 18. Dezember 2020. (2020)
Towards volume manufacturing of high-performance soft x-ray critical-angle transmission gratings. In: Space Telescopes and Instrumentation 2020: Ultraviolet to Gamma Ray, Bd. 4.
Konferenzbeitrag
11119, 111190S (Hg. O'Dell, S. L.; Pareschi, G.). SPIE OPTICAL ENGINEERING + APPLICATIONS, San Diego, CA, 11. August 2019 - 15. August 2019. (2019)
Soft x-ray reflectivity-enhancement in astronomical telescopes via overcoatings: alternative materials and deposition methods. In: Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX, Bd. 5.
Konferenzbeitrag
11119, 111190L (Hg. O'Dell, S. L.; Pareschi, G.). SPIE OPTICAL ENGINEERING + APPLICATIONS, San Diego, CA, 11. August 2019 - 15. August 2019. (2019)
Status of the silicon pore optics technology. In: Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX, Bd. 6.
Konferenzbeitrag
11119, 1111916 (Hg. O'Dell, S. L.; Pareschi, G.). SPIE OPTICAL ENGINEERING + APPLICATIONS, San Diego, CA, 11. August 2019 - 15. August 2019. (2019)
Developments in testing x-ray optics at MPE's PANTER facility. In: Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX, Bd.